Cover Image

Noise and information in nanoelectronics, sensors, and standards II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Sociedad Española de Optica
Other Authors: Smulko, Janusz M.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5472.
Subjects:
Noise > Congresses.
Noise control > Congresses.
Nanotechnology > Congresses.
Information technology > Congresses.
Detectors > Congresses.
Description
Physical Description:xxi, 442 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819453943