Society of Photo-optical Instrumentation Engineers, Sociedad Española de Optica, & Smulko, J. M. (2004). Noise and information in nanoelectronics, sensors, and standards II: 26-28 May 2004, Maspalomas, Gran Canaria, Spain. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Sociedad Española de Optica, and Janusz M. Smulko. Noise and Information in Nanoelectronics, Sensors, and Standards II: 26-28 May 2004, Maspalomas, Gran Canaria, Spain. Bellingham, Washington: SPIE, 2004.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Noise and Information in Nanoelectronics, Sensors, and Standards II: 26-28 May 2004, Maspalomas, Gran Canaria, Spain. SPIE, 2004.
Warning: These citations may not always be 100% accurate.