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A new ATPG algorithm to generate compact test sets which detect static and dynamic defects in VLSI circuits /

Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduce the overall defective part level. However, multiple observations of each fault site lead to increased test set size and require more tester memory. In this research, I propose a new ATPG algori...

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Bibliographic Details
Main Author: Lee, Sooryong
Format: Thesis Book
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 2003.
Subjects:
Major computer engineering.
Online Access:http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=764884701&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD

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