APA (7th ed.) Citation

Lee, S. (2003). A new ATPG algorithm to generate compact test sets which detect static and dynamic defects in VLSI circuits. [publisher not identified].

Chicago Style (17th ed.) Citation

Lee, Sooryong. A New ATPG Algorithm to Generate Compact Test Sets Which Detect Static and Dynamic Defects in VLSI Circuits. [Place of publication not identified]: [publisher not identified], 2003.

MLA (9th ed.) Citation

Lee, Sooryong. A New ATPG Algorithm to Generate Compact Test Sets Which Detect Static and Dynamic Defects in VLSI Circuits. [publisher not identified], 2003.