Wafer bonding : applications and technology /

Wafer fabrication : factory performance and analysis /
by: Atherton, Linda F.
Published: (1995)

Handbook of semiconductor wafer cleaning technology : science, technology, and applications /
Published: (1993)

Ultraclean surface processing of silicon wafers : secrets of VLSI manufacturing /
Published: (1998)

On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /
by: Rumiantsev, Andrej
Published: (2019)

Interlayer dielectrics for semiconductor technologies /
Published: (2003)

Interlayer dielectrics for semiconductor technologies /
Published: (2003)

Strength of Si wafers with microcracks : a theoretical model /
Published: (2008)

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado /
Published: (1996)

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California /
Published: (1998)

A Framework for standard modular simulation : application to semiconductor wafer fabrication /
Published: (2005)

International Symposium on Plasma Process-Induced Damage : [proceedings].
Published: (1996)

Interlayer dielectrics for semiconductor technologies /
Published: (2003)

Non-destructive damping measurement for wafer-level packaged microelectromechanical system (MEMS) acceleration switches /
by: Knight, Ryan, et al.
Published: (2014)

Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 /
Published: (1986)

Surface characterization for computer disks, wafers, and flat panel displays : 28 January 1999, San Jose, California /
Published: (1999)

Advanced microelectronic processing techniques : 28-30 November 2000, Singapore /
Published: (2000)

Semiconductor industry : wafer fab exhaust management /
by: Sherer, J. Michael, 1958-
Published: (2005)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)

High purity silicon VI : proceedings of the Sixth International Symposium /
Published: (2000)

Microchip fabrication : a practical guide to semiconductor processing /
by: Van Zant, Peter
Published: (2004)

Laser removal of Aluminum links for applications in wafer scale integrated circuits /
by: Parikh, Harshavadan B., 1957-
Published: (1987)

Dry etch technology : 9-10 September 1991, San Jose, California /
Published: (1992)

Wafer level reliability of advanced CMOS devices and processes /
Published: (2008)

In-situ temperature and thickness characterization for silicon wafers undergoing thermal annealing /
by: Vedantham, Vikram, 1979-
Published: (2003)

Development of advanced silicon drift detectors /
by: Valk, Hein, 1967-
Published: (1999)

IC layout basics : a practical guide /
by: Saint, Christopher, 1961-
Published: (2002)

Chemical bonds in semiconductors and thermodynamics /
Published: (1968)

Chemical bonds in semiconductors and solids /
Published: (1967)

Semiconductor technology : processing and novel fabrication techniques /
Published: (1997)

Handbook of 3D integration : technology and applications of 3D integrated circuits /
Published: (2008)

Two-dimensional semiconductors : synthesis, physical properties and applications /
by: Li, Jingbo
Published: (2020)

Handbook of semiconductor technology /
Published: (2000)

Handbook of semiconductor technology /
Published: (2000)

Handbook of semiconductor technology /
Published: (2000)

Handbook of semiconductor technology /
Published: (2000)

Wafer scale integration /
Published: (1989)