IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers, & Van Renesse, R. L. (2004). Optical security and counterfeit deterrence techniques V: 20-22 January 2004, San Jose, California, USA. SPIE.
Chicago Style (17th ed.) CitationIS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers, and Rudolf L. Van Renesse. Optical Security and Counterfeit Deterrence Techniques V: 20-22 January 2004, San Jose, California, USA. Bellingham, Washington: SPIE, 2004.
MLA (9th ed.) CitationIS & T--the Society for Imaging Science and Technology, et al. Optical Security and Counterfeit Deterrence Techniques V: 20-22 January 2004, San Jose, California, USA. SPIE, 2004.
Warning: These citations may not always be 100% accurate.