Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA /
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2004]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5303. |
| Subjects: |
| Physical Description: | vi, 204 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819452068 |