Image quality and system performance : 19-20 January 2004, San Jose, California, USA /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Miyake, Yoichi, Rasmussen, D. René
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5294.
Subjects:
Description
Physical Description:viii, 256 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819451975