Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Sociedad Española de Optica
Other Authors: Danneville, François
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5470.
Subjects:
Description
Physical Description:xxxi, 588 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081945396X