rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Estimating the expected latency to failure due to manufacturing defects
  name:
    name part: Dorsey, David Michael
    name part: 1980-
    role:
      role term: creator
  name:
    name part: Mercer, M. Ray
    role:
      role term: thesis advisor.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: txu
    date issued: 2004
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
  abstract: Manufacturers of digital circuits test their products to find defective parts so they are not sold to customers. Despite extensive testing, some of their products that are defective pass the testing process. To combat this problem, manufacturers have developed a metric called defective part level. This metric measures the percentage of parts that passed the testing that are actually defective. While this is useful for the manufacturer, the customer would like to know how long it will take for a manufacturing defect to affect circuit operation. In order for a defect to be detected during circuit operation, it must be excited and observed at the same time. This research shows the correlation between defect detection during automatic test pattern generation (ATPG) testing and normal operation for both combinational and sequential circuits. This information is then used to formulate a mathematical model to predict the expected latency to failure due to manufacturing defects.
  note: by David Michael Dorsey.
  note: "Major Subject: Computer Engineering"
  note: Title from author supplied metadata (automated record created on Apr. 30, 2004.)
  note: Vita.
  note: Abstract.
  note: Electronic resource.
  note: System requirements: Adobe Acrobat Reader.
  note: M. S. Texas A&M University 2003.
  note: Includes bibliographical references.
  note: Text (Thesis).
  subject:
    topic: Major computer engineering
  subject:
    topic: ATPG Testing
  subject:
    topic: MTTF
  subject:
    topic: ELF-MD
  subject:
    topic: ELF
  subject:
    topic: MPG-D
  subject:
    topic: DO-RE-ME
  identifier: http://hdl.handle.net/1969.1/202
  record info:
    record content source: TXA
    record creation date: 040616
    record change date: 20151026065208.0
    record identifier: in00001825322