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Sampling, wavelets, and tomography /

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Bibliographic Details
Other Authors: Benedetto, John, Zayed, Ahmed I.
Format: Book
Language:English
Published: Boston : Birkhäuser, [2004]
Series:Applied and numerical harmonic analysis.
Subjects:
Harmonic analysis.
Wavelets (Mathematics)
Fourier analysis.
Sampling (Statistics)
Tomography.
Description
Physical Description:xxi, 344 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0817643044 (acid-free paper)
3764343044 (acid-free paper)