rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Tests
    sub title: a comprehensive reference for assessments in psychology, education, and business
  name:
    name part: Sweetland, Richard C.
    name part: 1931-
  name:
    name part: Keyser, Daniel J.
    name part: 1935-
  type of resource: text
  origin info:
    place:
      place term: mou
    date issued: 1986
    edition: 2nd ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xii, 1122 pages ; 24 cm.
  note: Richard C. Sweetland, Daniel J. Keyser, general editors.
  note: Includes indexes.
  subject:
    topic: Psychological tests
  subject:
    topic: Educational tests and measurements
  subject:
    topic: Occupational aptitude tests
  subject:
    topic: Educational Measurement
  subject:
    topic: Psychological Tests
  subject:
    topic: Tests psychologiques
  subject:
    topic: Tests et mesures en éducation
  subject:
    topic: Affaires
    topic: Examens
  classification: BF176 .T43 1986
  classification: 153.9/3
  classification: BF 176 T345
  identifier: 0933701055
  identifier: 0933701063 (pbk.)
  identifier: 0933701039 (lib. bdg.)
  identifier: 0890792135
  identifier: 86014416
  record info:
    record content source: DNLM/DLC
    record creation date: 860619
    record change date: 20151026051953.0
    record identifier: in00001801552