Defect site prediction based upon statistical analysis of fault signatures /
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| Other Authors: | |
| Format: | Thesis eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
2003.
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| Subjects: | |
| Online Access: | Link to OAK Trust copy |
| Abstract: | Good failure analysis is the ability to determine the site of a circuit defect quickly and accurately. We propose a method for defect site prediction that is based on a site's probability of excitation, making no assumptions about the type of defect being analyzed. We do this by analyzing fault signatures and comparing them to the defect signature. We use this information to construct an ordered list of sites that are likely to be the site of the defect. |
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| Item Description: | "Major Subject: Computer Engineering" Title from author supplied metadata. Electronic resource. |
| Format: | Mode of access: World Wide Web. |
| Bibliography: | Includes bibliographical references. |