Noise in complex systems and stochastic dynamics : 2-4 June 2003, Santa Fe, New Mexico, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Schimansky-Geier, Lutz, 1950-
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2003]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5114.
Subjects:	Noise > Congresses. Nonlinear systems > Noise > Congresses. Stochastic processes > Congresses. System analysis > Congresses.

Description
Physical Description:	xxi, 534 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0819449741