http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
hardware-in-the-loop testing VIII : 21-22 April 2003, Orlando, Florida, USA
Society of Photo-optical Instrumentation Engineers
viii, 322 pages : illustrations ; 28 cm.
Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
Includes bibliographical references and index.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5092