Technologies for synthetic environments : hardware-in-the-loop testing VIII : 21-22 April 2003, Orlando, Florida, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Murrer, Robert Lee, Jr
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5092.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5092.toc
Description
Physical Description:viii, 322 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819449520