rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Proceedings International Test Conference 2003
    sub title: [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA
  title info:
    title: ITC International Test Conference 2003
  name:
    name part: International Test Conference 2003 : Charlotte, N.C.)
    role:
      role term: creator
  name:
    name part: IEEE Computer Society
    name part: Test Technology Technical Committee.
  name:
    name part: Institute of Electrical and Electronics Engineers
    name part: Philadelphia Section.
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: nju
    date issued: 2003
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xvi, 1334 pages : illustrations ; 29 cm.
  note: sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
  note: At head of title: ITC International Test Conference 2003
  note: Conference number inferred.
  note: "IEEE catalog number 03CH37494"--Title page verso.
  note: Includes bibliographical references and index.
  subject:
    topic: Integrated circuits
    topic: Testing
    genre: Congresses
  subject:
    topic: Electronic digital computers
    topic: Circuits
    topic: Testing
    genre: Congresses
  subject:
    topic: Telecommunication
    genre: Congresses
  subject:
    topic: Radio frequency
    genre: Congresses
  identifier: 0780381068
  record info:
    record content source: LHL
    record creation date: 031013
    record change date: 20151025110705.0
    record identifier: in00001790018