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Lightmetry 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Poland Chapter, Institute of Applied Optics (Poland), Komitet Badań Naukowych (Poland)
Other Authors: Pluta, Maksymilian, Szyjer, Mariusz, Powichrowska, Ewa
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:SPIE Poland Chapter proceedings ; 68.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5064.
Subjects:
Light > Congresses.
Polarization (Light) > Congresses.
Optical measurements > Congresses.
Optical detectors > Congresses.
Measurement > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5064.toc
Description
Item Description:Previous conference entitled: Lightmetry : metrology, spectroscopy, and testing techniques using light.
Physical Description:xx, 338 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819448702