Basis document for large early release frequency (LERF) significance determination process (SDP) : inspection findings that may affect LERF.

Bibliographic Details
Corporate Author: U.S. Nuclear Regulatory Commission. Division of Risk Analysis and Applications
Format: Government Document Microform Book
Language:English
Published: Washington, DC : Division of Risk Analysis and Applications, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission : [2002]
Subjects:
Online Access:Web-based or Citrix-based files available for download
Description
Item Description:Cataloging from surrogate.
Shipping list number: 2003-0172-M.
"Date published: December 2002."
Shipping List Date: 04/04/2003
"NUREG-1765."
Microform.
Physical Description:1 volume (various pagings)
Also available via Internet from NRC web site. Address as of 5/6/04: http://www.nrc.gov/reading-rm/adams.html; current access available via PURL.
Bibliography:Includes bibliographical references.
ISBN:0160676584