Cover Image

Polarimetry in astronomy : 25-28 August 2002, Waikoloa, Hawaii, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, International Commission for Optics
Other Authors: Fineschi, Silvano
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2003]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4843.
Subjects:
Polarimetry > Congresses.
Astronomical spectroscopy > Congresses.
X-ray astronomy > Congresses.
Infrared astronomy > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4843.toc
Description
Physical Description:xii, 558 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081944622X