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X-ray and gamma-ray detectors and applications IV : 7-9 July 2002, Seattle, Washington, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Boeing Company, SPIE Conference on Hard X-Ray and Gamma-Ray Detector Physics, Conference on X-Ray Detectors
Other Authors:	James, R. B. (Ralph B.)
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2002]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4784.
Subjects:	X-ray optics > Congresses. Gamma ray detectors > Congresses. Semiconductor nuclear counters > Congresses. Optical detectors > Congresses. Optical radiometry > Congresses.

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