Cover Image

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors: Duparré, Angela, Singh, B. (Bhanwar)
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4779.
Subjects:
Optical materials > Congresses.
Semiconductors > Characterization > Congresses.
Information storage and retrieval systems > Congresses.
Metrology > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4779.toc
Description
Physical Description:viii, 192 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819445460