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Proceedings International Test Conference 2002 /

Bibliographic Details
Corporate Authors: International Test Conference Baltimore, Maryland, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Piscataway, New Jersey : International Test Conference ; IEEE, [2002]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Telecommunication > Congresses.
Radio frequency > Congresses.
Description
Item Description:Conference number inferred.
"IEEE catalog number 02CH37382"--Title page verso.
Physical Description:xvi, 1250 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references and ndex.
ISBN:0780375424