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CTL for test information of digital ICs /

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Bibliographic Details
Main Author: Kapur, Rohit
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, 2003.
Subjects:
Digital integrated circuits > Testing > Standards.
Computer hardware description languages.
Online Access:Table of contents
Description
Physical Description:ix, 173 pages : illustrations ; 24 cm.
ISBN:1402072937