Cover Image

Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life : 9-13 September 2002, Novosibirsk, Russia /

Bibliographic Details
Corporate Authors: International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life Novosibirsk, Russia, Society of Photo-optical Instrumentation Engineers, Scientific Instrument Engineering (Russia). Technological Design Institute, Institut lazernoĭ fiziki SO RAN, International Measurement Confederation, Institut avtomatiki i ėlektrometrii (Rossiĭskai︠a︡ akademii︠a︡ nauk)
Other Authors: Chugui, Yuri V.
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4900.
Subjects:
Measurement > Congresses.
Optical measurements > Industrial applications > Congresses.
Lasers > Industrial applications > Congresses.
Laser interferometers > Congresses.
Description
Physical Description:2 volumes (xxiv, 1332 pages) : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819446866