Cover Image

Interferometry XI : applications, 10-11 July 2002, Seattle, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Boeing Company
Other Authors: Osten, Wolfgang
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4778.
Subjects:
Interferometry > Congresses.
Interferometry > Industrial applications > Congresses.
Measurement > Congresses.
Description
Physical Description:x, 486 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819445452