System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday /

Bibliographic Details
Other Authors: Hayakawa, Yu, Irony, Telba, Xie, M. (Min), Barlow, Richard E.
Format: Book
Language:English
Published: Singapore ; River Edge, NJ : World Scientific, [2001]
Series:Series on quality, reliability & engineering statistics ; v. 5.
Subjects:
Description
Physical Description:xxvii, 409 pages : illustrations ; 23 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9810248652