http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Test and measurement applications of optoelectronic devices
viii, 180 pages : illustrations ; 28 cm.
Aland K. Chin [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Includes bibliographical references and index.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4648