rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Test and measurement applications of optoelectronic devices
    sub title: 21-22 January 2002, San Jose, USA
  name:
    name part: Chin, Aland K.
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: wau
    date issued: 2002
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: viii, 180 pages : illustrations ; 28 cm.
  note: Aland K. Chin [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
  note: Includes bibliographical references and index.
  subject:
    topic: Optoelectronic devices
    topic: Testing
    genre: Congresses
  subject:
    topic: Optoelectronic devices
    topic: Reliability
    genre: Congresses
  related item:
    title info:
      title: Proceedings of SPIE--the International Society for Optical Engineering ; v. 4648
  identifier: 0819443875
  record info:
    record content source: TEF
    record creation date: 020524
    record change date: 20151024143424.0
    record identifier: in00001685958