rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Proceedings
  title info:
    title: Proc. - Int. Symp. Test Fail Anal
  title info:
    title: Proceedings of the ... International Symposium for Testing and Failure Analysis
  title info:
    title: Conference proceedings
  title info:
    title: ISTFA, <1991-1992, 2000-2001>
  title info:
    title: Proceedings of the Microelectronics Symposium
  title info:
    title: Proceedings of the Advanced Materials Symposium
  title info:
    title: Conference proceedings from the ... International Symposium for Testing and Failure Analysis
  title info:
    title: Conference proceedings <1995->
  name:
    name part: International Symposium for Testing and Failure Analysis.
    role:
      role term: creator
  name:
    name part: Microelectronics Symposium.
  name:
    name part: Advanced Materials Symposium.
  type of resource: text
  genre: conference publication
  origin info:
    place:
      place term: ohu
    date issued: 1980
    date issued: 9999
    issuance: continuing
    frequency: Annual
  language:
    language term: eng
  physical description:
    form: print
    extent: volumes : illustrations ; 28 cm.
  note: International Symposium for Testing and Failure Analysis.
  note: Description based on: 1986.
  note: Issue for 1987 published in 2 volumes called also: Proceedings of the Microelectronics Symposium, and: Proceedings of the Advanced Materials Symposium.
  note: Volumes for 1987-<1992> have cover title: Proceedings of the ... International Symposium for Testing and Failure Analysis.
  note: Volumes for <1996- > have cover title: Conference proceedings.
  note: Issued also 1999- on CD-ROM as: Conference proceedings from the ... International Symposium for Testing and Failure Analysis.
  subject:
    topic: Electronics
    topic: Materials
    topic: Testing
    genre: Congresses
  subject:
    topic: Materials
    topic: Testing
    genre: Congresses
  subject:
    topic: Electronic apparatus and appliances
    topic: Testing
    genre: Congresses
  subject:
    topic: Semiconductors
    topic: Testing
    genre: Congresses
  classification: TK7871 .I59a
  classification: 621.381
  related item:
    title info:
      title: Conference proceedings from the ... International Symposium for Testing and Failure Analysis
    name:
      name part: International Symposium for Testing and Failure Analysis.
    identifier: (DLC) 2001242004
    identifier: (OCoLC)45739974
  related item:
    title info:
      title: International Symposium for Testing and Failure Analysis [electronic resource] : ISTFA : [proceedings]
    name:
      name part: International Symposium for Testing and Failure Analysis.
    identifier: (DLC) 2002208745
    identifier: (OCoLC)49789480
  identifier: 0890-1740
  identifier: sn 86011950
  identifier: 88641497
  identifier: ASM International, Metals Park, OH 44073
  record info:
    record content source: CXE
    record creation date: 020214
    record change date: 20151024131511.0
    record identifier: in00001671994