http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Proceedings of the ... International Symposium for Testing and Failure Analysis
Proceedings of the Microelectronics Symposium
Proceedings of the Advanced Materials Symposium
Conference proceedings from the ... International Symposium for Testing and Failure Analysis
International Symposium for Testing and Failure Analysis.
Issue for 1987 published in 2 volumes called also: Proceedings of the Microelectronics Symposium, and: Proceedings of the Advanced Materials Symposium.
Volumes for 1987-<1992> have cover title: Proceedings of the ... International Symposium for Testing and Failure Analysis.
Volumes for <1996- > have cover title: Conference proceedings.
Issued also 1999- on CD-ROM as: Conference proceedings from the ... International Symposium for Testing and Failure Analysis.
International Symposium for Testing and Failure Analysis [electronic resource] : ISTFA : [proceedings]
ASM International, Metals Park, OH 44073