Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability /
| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
River Edge, NJ :
World Scientific,
[2002]
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| Series: | Selected topics in electronics and systems ;
v. 23. |
| Subjects: |
| Physical Description: | ix, 270 pages : illustrations ; 26 cm. |
|---|---|
| ISBN: | 9810248423 |