Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August, 2001, San Diego, USA /

Wave optics and VLSI photonic devices for information processing : 2-3 August 2001, San Diego, USA /
Published: (2001)

Optical devices and diagnostics in materials science : 1-4 August 2000, San Diego, USA /
Published: (2000)

Industrial applications of optical inspection, metrology, and sensing : 19-20 November 1992, Boston, Massachusetts /
Published: (1993)

Selected papers on optical methods in surface metrology /
Published: (1996)

Instruments for optics and optoelectronic inspection and control : 8-10 November 2000, Beijing, China /
Published: (2000)

Micromachining technology for micro-optics : 20 September 2000, Santa Clara, USA /
Published: (2000)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August 2005, San Diego, California, USA /
Published: (2005)

Optical metrology in production engineering : 27-30 April 2004, Strasbourg, France /

Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA /
Published: (2007)

Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida /
Published: (1987)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA /
Published: (2003)

Micro-optic applications in food, textile and geo sciences /
by: Swatland, Howard
Published: (2026)

Laser metrology and inspection : 14-15 June 1999, Munich, Germany /
Published: (1999)

International Conference on Applied Optical Metrology : 8-11 June 1998, Balatonfüred, Hungary /
Published: (1998)

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG /
Published: (1997)

Nonlinear dynamics and spatial complexity in optical systems : the Forty-first Scottish Universities' Summer School in Physics, Edinburgh, August 1992 /
Published: (1993)

Optical networking /
Published: (1999)

Laser dimensional metrology : recent advances for industrial application, 5-7 October 1993, Brighton, United Kingdom /
Published: (1994)

Semiconductor optoelectronic device manufacturing and applications : 7-9 November 2001, Nanjing, China /
Published: (2001)

Optical modeling and performance predictions II : 3-4 August 2005, San Diego, California, USA /
Published: (2005)

Opto-Ireland 2002 : optics and photonics technologies and applications : 5-6 September 2002, Galway, Ireland /
Published: (2003)

Nonlinear materials, devices, and applications : 24-25 January 2000, San Jose, California /
Published: (2000)

Harnessing light : optical science and metrology at NIST : 1 August 2001, San Diego, USA /
Published: (2001)

Optical diagnostic methods for inorganic transmissive materials : 20-21 July 1998, San Diego, California /
Published: (1998)

In-process optical measurements and industrial methods : 14-15 March 1990, The Hague, The Netherlands /
Published: (1990)

Optical micro- and nanometrology in manufacturing technology : 29-30 April 2004, Strasbourg, France /
Published: (2004)

Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France /
Published: (1996)

Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February 2005, Merida, Yucatan, Mexico /
Published: (2005)

Optical techniques for environmental sensing, workplace safety, and health monitoring : 24-25 October 2001, Warsaw, Poland /
Published: (2002)

Surface scattering and diffraction for advanced metrology : 1 August 2001, San Diego, USA /
Published: (2001)

Optical modeling and performance predictions III : 29-30 August 2007, San Diego, California, USA /
Published: (2007)

Optical modeling and perfomance predictions : 6-7 August 2003, San Diego, California, USA /
Published: (2004)

Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts /
Published: (1995)

Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life : 9-13 September 2002, Novosibirsk, Russia /
Published: (2002)

Surface science techniques /
Published: (2013)

Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics : 14-15 November 2001, Moscow, Russia /
Published: (2003)