Soft x-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Tichenor, Daniel A., Folta, James A.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4506.
Subjects:

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