Cover Image

ITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA /

Bibliographic Details
Corporate Authors: International Test Conference Baltimore, Maryland, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Piscataway, New Jersey : International Test Conference ; IEEE, [2001]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Telecommunication > Congresses.
Radio frequency > Congresses.
Description
Item Description:"IEEE Catalog Number 01CH37260"--Title page verso.
Physical Description:xiv, 1201 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0780371690
0780371704 (micofiche edition)