Cover Image

Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Murrer, Robert Lee, Jr
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4366.
Subjects:
Guided missiles > Testing > Congresses.
Infrared detectors > Congresses.
Guidance systems (Flight) > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4366.toc
Description
Physical Description:x, 530 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819440612