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Second Indicator |
Subfields |
| LEADER |
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| 001 |
in00001637621 |
| 005 |
20151023064009.0 |
| 008 |
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|a TK8300
|b .T47 2001
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| 245 |
0 |
0 |
|a Testing, reliability, and applications of optoelectronic devices :
|b 24-26 January 2001, San Jose, USA /
|c Aland K. Chin [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
|
| 264 |
|
1 |
|a Bellingham, Washington :
|b SPIE,
|c [2001]
|
| 264 |
|
4 |
|c ©2001
|
| 300 |
|
|
|a xxxii, 246 pages :
|b illustrations ;
|c 28 cm.
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
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| 338 |
|
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|a volume
|b nc
|2 rdacarrier
|
| 490 |
1 |
|
|a Proceedings / SPIE--the international society for optical engineering ;
|v v. 4285
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Optoelectronic devices
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Optoelectronic devices
|x Reliability
|v Congresses.
|
| 700 |
1 |
|
|a Chin, Aland K.
|
| 830 |
|
0 |
|a Proceedings of SPIE--the International Society for Optical Engineering ;
|v v. 4285.
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| 948 |
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|a cataloged
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|a Texas A&M University
|b Rellis Campus
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