Cover Image

Testing, reliability, and applications of optoelectronic devices : 24-26 January 2001, San Jose, USA /

Bibliographic Details
Other Authors: Chin, Aland K.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4285.
Subjects:
Optoelectronic devices > Testing > Congresses.
Optoelectronic devices > Reliability > Congresses.
Description
Physical Description:xxxii, 246 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819439630