APA (7th ed.) Citation

Chin, A. K. (2001). Testing, reliability, and applications of optoelectronic devices: 24-26 January 2001, San Jose, USA. SPIE.

Chicago Style (17th ed.) Citation

Chin, Aland K. Testing, Reliability, and Applications of Optoelectronic Devices: 24-26 January 2001, San Jose, USA. Bellingham, Washington: SPIE, 2001.

MLA (9th ed.) Citation

Chin, Aland K. Testing, Reliability, and Applications of Optoelectronic Devices: 24-26 January 2001, San Jose, USA. SPIE, 2001.