Cover Image

Proceedings of the ... IEEE International Conference on Microelectronic Test Structures.

Show other versions (1)
Bibliographic Details
New Title:IEEE International Conference on Microelectronic Test Structures. Proceedings of the ... International Conference on Microelectronic Test Structures
Corporate Authors: IEEE International Conference on Microelectronic Test Structures, IEEE Electron Devices Society
Format: Conference Proceeding
Language:English
Published: New York, N.Y. : Institute of Electrical and Electronics Engineers, 1986 [i.e. 1988]
Subjects:
Electronic apparatus and appliances > Testing > Congresses.
Microelectronics > Congresses.
Online Availability: Check for online availability
Description
Published:1988.
Physical Description:1 volume : illustrations ; 28 cm.
Also issued by subscription, in PDF format, via the World Wide Web.
Publication Frequency:Annual
ISSN:1071-9032