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Applied logistic regression /

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Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York : Wiley, [2000]
Edition:2nd ed.
Series:Wiley series in probability and statistics. Texts and references section.
Subjects:
Regression analysis.
Description
Item Description:"A Wiley-Interscience publication."
Physical Description:xii, 375 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages 354-367) and index.
ISBN:0471356328 (cloth : alk. paper)