Nonlinear image processing and pattern analysis XII : 22-23 January 2001, San Jose, USA /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Dougherty, Edward R., Astola, Jaakko
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4304.
Subjects:
Description
Item Description:Previous volumes entitled: Nonlinear image processing.
Physical Description:vii, 328 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819439827