Diagnosing manufacturing process variation using higher order statistics : a blind source separation approach /
A large volume of multivariate data is available from the manufacturing process. A new statistical approach in the context of signal processing is investigated to diagnose the root causes of unusual variability from the multivariate measurement data. Since the existing statistical approaches, which...
| Main Author: | Lee, Ho Young |
|---|---|
| Format: | Thesis eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
2000.
|
| Subjects: | |
| Online Access: | Link to OAKTrust copy |
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