Lee, H. Y. (2000). Diagnosing manufacturing process variation using higher order statistics: A blind source separation approach. [publisher not identified].
Chicago Style (17th ed.) CitationLee, Ho Young. Diagnosing Manufacturing Process Variation Using Higher Order Statistics: A Blind Source Separation Approach. [Place of publication not identified]: [publisher not identified], 2000.
MLA (9th ed.) CitationLee, Ho Young. Diagnosing Manufacturing Process Variation Using Higher Order Statistics: A Blind Source Separation Approach. [publisher not identified], 2000.
Warning: These citations may not always be 100% accurate.