Cover Image

Reliability physics.

Bibliographic Details
New Title:IEEE international reliability physics proceedings
Previous Title:Reliability Physics Symposium. Proceedings
Corporate Authors: International Reliability Physics Symposium, IEEE Electron Devices Society, IEEE Reliability Group, IEEE Reliability Society, Institute of Electrical and Electronics Engineers. Electron Devices Group
Format: Conference Proceeding
Language:English
Published: New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, -[1993]
Subjects:
Electronic apparatus and appliances > Reliability > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Integrated circuits > Testing > Congresses.
Online Availability: Check for online availability
Description
Published:Began with: 8th (Apr. 7-10, 1970); ceased with: 31st (Mar. 23-25, 1993).
Physical Description:volumes : illustrations ; 28 cm.
Also issued online.
Publication Frequency:Annual
ISSN:0735-0791
1082-7285