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Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2001, San Jose, CA USA, March 20-22, 2001 /

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Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: Piscataway, New Jersey : IEEE, [2001]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
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Published 2003
Conference Proceeding Book
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Published 2000
Conference Proceeding Book
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