Cover Image

Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2001, San Jose, CA USA, March 20-22, 2001 /

Show other versions (2)
Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: Piscataway, New Jersey : IEEE, [2001]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Description
Item Description:"IEEE Catalog Number 01CH37189"--Title page verso.
Cover title.
Physical Description:xi, 260 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:0780366492 (softbound)
0780366506 (microfiche)
0780366514 (CD-ROM ed.)