rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Machine vision and three-dimensional imaging systems for inspection and metrology
    sub title: 6-8 November 2001 [as printed], Boston, USA
  name:
    name part: Harding, Kevin G.
  name:
    name part: Miller, John W. V.
  name:
    name part: Batchelor, Bruce G.
  name:
    name part: Society of Photo-optical Instrumentation Engineers
  type of resource: text
  genre: conference publication
  origin info:
    place:
      place term: wau
    date issued: 2001
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: vii, 296 pages : illustrations ; 28 cm.
  note: Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
  note: Includes bibliographical references and index.
  subject:
    topic: Computer vision
    genre: Congresses
  subject:
    topic: Computer vision
    topic: Industrial applications
    genre: Congresses
  subject:
    topic: Three-dimensional display systems
    genre: Congresses
  subject:
    topic: Quality control
    topic: Optical methods
    genre: Congresses
  subject:
    topic: Metrology
    genre: Congresses
  related item:
    title info:
      title: Proceedings of SPIE--the International Society for Optical Engineering ; v. 4189
  identifier: 0819438545
  record info:
    record content source: CUS
    record creation date: 010413
    record change date: 20151023053541.0
    record identifier: in00001611105