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Electron microscopy and analysis /

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Bibliographic Details
Main Author: Goodhew, Peter J.
Other Authors: Humphreys, F. J., Beanland, R.
Format: Book
Language:English
Published: London ; New York : Taylor & Francis, 2001.
Edition:3rd ed.
Subjects:
Electron microscopy.
Description
Physical Description:x, 251 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (pages [236]-237) and index.
ISBN:0748409688 (pbk. : alk. paper)