| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000cam a22000004a 4500 |
| 001 |
in00001600532 |
| 005 |
20151022170919.0 |
| 008 |
000710s2000 nyua b 001 0 eng |
| 010 |
|
|
|a 00058756
|
| 020 |
|
|
|a 030646487X
|
| 035 |
|
|
|a (OCoLC)ocm44619481
|
| 040 |
|
|
|a DLC
|c DLC
|d TXA
|d UtOrBLW
|
| 042 |
|
|
|a pcc
|
| 049 |
|
|
|a TXAM
|
| 050 |
0 |
0 |
|a TA417.23
|b .E419 2000
|
| 082 |
0 |
0 |
|a 620.1/1299
|2 21
|
| 245 |
0 |
0 |
|a Electron backscatter diffraction in materials science /
|c edited by Adam J. Schwartz, Mukul Kumar, and Brent L. Adams.
|
| 264 |
|
1 |
|a New York :
|b Kluwer Academic,
|c [2000]
|
| 264 |
|
4 |
|c ©2000
|
| 300 |
|
|
|a xvi, 339 pages :
|b illustrations ;
|c 26 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Materials
|x Microscopy.
|
| 650 |
|
0 |
|a Scanning electron microscopy.
|
| 650 |
|
0 |
|a Crystallography.
|
| 700 |
1 |
|
|a Schwartz, Adam J.
|
| 700 |
1 |
|
|a Kumar, Mukul.
|
| 700 |
1 |
|
|a Adams, B. L.
|q (Brent L.)
|
| 948 |
|
|
|a cataloged
|b h
|c 2001/2/23
|d c
|e jspillan
|f 10:11:39 am
|
| 994 |
|
|
|a E0
|b TXA
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s 93869801-af65-3ddc-b353-86a02f5a3909
|i f21c5959-e0b7-3a6e-90a5-1c92f8fc1cfa
|t 0
|
| 952 |
f |
f |
|p normal
|a Texas A&M University
|b College Station
|c Sterling C. Evans Library
|s Evans stk
|d Evans: Library Stacks
|t 0
|e TA417.23 .E419 2000
|h Library of Congress classification
|i unmediated -- volume
|m A14827177493
|