Electron backscatter diffraction in materials science /

Bibliographic Details
Other Authors:	Schwartz, Adam J., Kumar, Mukul, Adams, B. L. (Brent L.)
Format:	Book
Language:	English
Published:	New York : Kluwer Academic, [2000]
Subjects:	Materials > Microscopy. Scanning electron microscopy. Crystallography.

Description
Physical Description:	xvi, 339 pages : illustrations ; 26 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	030646487X