Direct, witnessed, and verbally-mediated exposure, fear of interpersonal victimization, dissociation and emotional distress among a biethnic sample of college students : a structural modeling analysis /

Structural Equation Modeling analyses (SEM) were used to examine relationships among three modes of exposure to interpersonal violence, dissociation, fear of victimization and distress in a biethnic sample of 344 university students. A four-factor model (with direct exposure as the exogenous variab...

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Bibliographic Details
Main Author: McGruder-Johnson, Anita Kay
Format: Thesis Book
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 2000.
Subjects:
Online Access:http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=731980961&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD
Description
Summary:Structural Equation Modeling analyses (SEM) were used to examine relationships among three modes of exposure to interpersonal violence, dissociation, fear of victimization and distress in a biethnic sample of 344 university students. A four-factor model (with direct exposure as the exogenous variable) was specified on 239 African American and European American females. In addition, the model was respecified (with witnessed exposure and verbally-mediated exposure as the exogenous variables) on a mixed-gender African American sample of the data. For all types of exposure, the structural models supported mediation effects for dissociation. The data suggest that dissociative experiences and subsequent PTSD-related distress are sequelae of direct exposure, witnessed exposure and verbally-mediated exposure to interpersonal violence. In addition, the data suggest that the relationship between witnessed or verbally-mediated exposure to interpersonal violence, dissociative experiences and PTSD-related distress was more relevant for the African American students than European Americans students in our sample.
Item Description:Vita.
"Major Subject: Psychology".
Physical Description:xii, 116 leaves : illustrations ; 28 cm.
Issued also on microfiche from University Microfilm Inc.
Bibliography:Includes bibliographical references (leaves 57-69).